Bringing Advanced X-ray Insights into the Home Laboratory
Advanced X-ray methods are increasingly moving from specialist facilities into routine laboratory workflows. In this contribution, we present recent developments that extend the analytical capabilities of Malvern Panalytical X-ray platforms, from compact thin-film metrology to element-specific local-structure analysis and advanced crystallographic interpretation.
Enabled by hybrid pixel area-detector technology, frame-based 1D acquisition brings new speed, flexibility and simplicity to X-ray reflectometry. This approach, previously associated with floor-standing diffractometers, is now being implemented on the compact Aeris platform, making XRR more accessible, alignment free while preserving the ease of use expected from a compact system.
At the other end of the platform range, Empyrean’s multipurpose architecture and modular optics combined advanced detector technology enables laboratory X-ray absorption spectroscopy as a complement to conventional diffraction. Recent work published demonstrated transmission-mode XAS on a laboratory powder diffractometer, enabling XANES and EXAFS measurements without requiring synchrotron access [1].
Finally, we will show how the HighScore suite supports the interpretation of increasingly complex diffraction data, including phase identification, Rietveld analysis, crystallographic analysis and workflows for challenging multiphase systems with unknown crystal structure [2]. Together, these developments illustrate how compact and multipurpose laboratory X-ray platforms can broaden access to thin-film metrology, local-structure analysis and robust structure determination in the home laboratory.
References
[1] M. Gateshki, C. Zarkadas and D. Beckers, “Application of X-ray absorption spectroscopy with a laboratory X-ray powder diffractometer,” Journal of Applied Crystallography, 2026.
[2] T. Degen, M. Sadki, E. Bron, U. König and G. Nénert, “The HighScore suite,” Powder Diffraction, 29, Supplement S2, S13–S18, 2014.